用于内建自测试的测试向量生成器TPG的版图设计  

Layout design of test vector generator for built-in self-test

作　　者：保慧琴[1] 张健[1] 翟书颖 BAO Hui-qin;ZHANG Jian;ZHAI Shu-ying(Northwestern Polytechnical University Mingde College,Xi’an 710124,China)

机构地区：[1]西北工业大学明德学院,陕西西安710124

出　　处：《电子设计工程》2020年第19期161-165,共5页Electronic Design Engineering

摘　　要：内建自测试是一种可测性设计方法,需要用到测试向量生成器TPG完成测试生成,为了提高测试故障覆盖率,文中利用Tanner Pro软件设计了一种基于本原多项式的伪随机测试向量生成模块,可以产生最大长度的伪随机向量。本文利用S-edit完成四阶的原理图设计,利用L-edit完成版图设计,通过T-spice软件进行仿真,并对仿真结果进行分析,仿真结果说明,四阶伪随机测试向量生成模块所产生的伪随机测试向量循环长度为15,向量循环顺序由触发器的初始状态决定。Built-in self-test is a testability design method,needs to use the test vector generator to complete the test generation.In order to improve the test fault coverage,using Tanner Pro software to design a pseudorandom test vector generation module based on primitive polynomial,the maximum length pseudorandom vector can be generated.Using S-edit to complete the schematic design,using L-edit to complete the Layout design.The T-spice software simulation results show that the cyclic length of fourthorder pseudorandom test vector generation module is 15,and the cyclic order is determined by the initial state of D flip-flop.

关 键 词：内建自测试 测试生成 本原多项式 LFSR 版图 

分 类 号：TN79[电子电信—电路与系统]