基于STM32的数字集成电路测试仪的设计  

Design of digital integrated circuit tester based on STM32

作　　者：于宝堃[1] 石晟屹 马望男 李寅博 YU Baokun;SHI Shengyi;MA Wangnan;LI Yinbo(College of Electronic Information and Automation,Tianjin University of Science&Technology,Tianjin 300457,China)

机构地区：[1]天津科技大学电子信息与自动化学院,天津300457

出　　处：《实验室科学》2021年第4期71-73,78,共4页Laboratory Science

基　　金：天津科技大学大学生实验室创新基金(项目编号:1902A401)。

摘　　要：设计了一种基于STM32的数字集成电路测试仪,用于检测74LS00、74LS20等实验教学中常用的74系列芯片。系统将功能测试法和参数测试法相结合,以检测被测芯片的逻辑功能和扇出能力。采用STM32F103VET6作为微控制器,通过按键可对其进行操作,构建了引脚配置与选择单元,以满足74系列芯片的引脚需求,利用A/D转换单元来获取输出电流,测试结果在LCD屏中显示。实际测试结果表明:该测试仪操作简单,测试时间短,能准确测量芯片的性能,满足实验教学的需求。A digital integrated circuit tester based on STM32 was designed to detect 74 series chips commonly used in experimental teaching,such as 74LS00 and 74LS20.The system combined functional testing method with parametric testing method so that logical function and fan out capability of chip to be tested can be detected.The tester used STM32F103VET6 as micro-controller,with use of keys to operate.To meet the needs of pin count of 74 series chips,tester built pin configuration and selection unit.Output current of chip under test can be got by A/D convert unit.The test result was displayed on the LCD display.The actual test results showed that the tester has features of easy operation,short testing time,which can accurately measure the performance of the chip and meet the needs of experimental teaching.

关 键 词：STM32 数字集成电路测试仪 实验教学 

分 类 号：TN46[电子电信—微电子学与固体电子学]