基于ATE的USB PD快充协议芯片晶圆测试  

USB PD Fast Charging Protocol Chip Probe Test Based on ATE

作　　者：唐彩彬 TANG Caibin(China Key System&Integrated Circuit Co.,Ltd.,Wuxi 214072,China)

机构地区：[1]中科芯集成电路有限公司,江苏无锡214072

出　　处：《电子与封装》2022年第3期30-34,共5页Electronics & Packaging

摘　　要：介绍了一款USB功率传输(Power Delivery,PD)快充协议芯片的晶圆测试方法。基于Chroma 3380P测试系统,通过对USB PD快充协议芯片测试要求进行分析,设计了双site并行测试外围电路,实现了对该USB PD快充协议芯片的主要功能与性能参数测试。该方案能够作为通用测试方法供USB PD快充协议芯片测试设计参考。A chip probe test method for USB power delivery(PD)fast charging protocol chip is introduced.By analyzing the test requirements of USB PD fast charging protocol chip,2-site parallel test peripheral circuit is designed based on the Chroma 3380P test system.The design is able to realize testing the main functions and performance parameters of the USB PD fast charging protocol chip.This scheme can be used as a general test method for reference of USB PD fast charging protocol chip.

关 键 词：ATE Chroma 3380P USB PD 晶圆测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]