抗辐射加固技术发展动态研究  

Research on the Development Trends of Radiation Hardened Technology

作　　者：毛海燕[1] 赖凡[2] 谢家志[2] 张健[2] MAO Haiyan;LAI Fan;XIE Jiazhi;ZHANG Jian(The 26th Institute of China Electronic Technology Group Corporation,Chongqing 400060,P.R.China;The 24th Institute of China Electronic Technology Group Corporation,Chongqing 400060,P.R.China)

机构地区：[1]中国电子科技集团公司第二十六研究所,重庆400060 [2]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《微电子学》2022年第2期197-205,共9页Microelectronics

基　　金：国家自然科学基金资助项目(60906009);中国博士后科学基金资助项目(20090451423);重庆科委基金资助项目(CSTC2010AA2004)。

摘　　要：辐射效应已成为影响集成电路(IC)在宇宙空间可靠应用的主要因素。文章对IC抗辐射加固技术的研究进展进行了综述。首先,简介了抗辐射加固技术。然后,综述了抗辐射加固技术国外发展动态,介绍了美国在抗辐射加固技术方面的管理方式、技术路线、进展及典型应用。最后介绍了国内相关技术的进展,指出研究美国抗辐射加固技术的发展动态可促进国内抗辐射加固技术的发展。该综述对国内抗辐射加固技术的实际应用及推广具有一定借鉴意义。The radiation effect has become a major issue affecting the reliable application of integrated circuits in space. The research progress of radiation resistant reinforcement technology was reviews in this article. Firstly, the radiation resistant reinforcement technology was introduced. Then, the foreign research development and current situation of radiation resistant reinforcement technology were reviewed, and the management approach, technical route, results and progress of the United States in radiation resistant reinforcement technology were introduced. Finally, the progress of the domestic radiation resistant reinforcement technology was introduced. It pointed out that the study of the development of radiation resistant reinforcement technology in the United States could promote the development of radiation resistant reinforcement technology in China. This review had certain significance for the practical application and promotion of anti-irradiation reinforcement technology.

关 键 词：抗辐射加固 集成电路 航天电子 高性能空间飞行计算 

分 类 号：TN406[电子电信—微电子学与固体电子学]