基于静态输入检测的ADC单粒子效应测试系统  

A Single Event Effect Test System for Analog-to-Digital Converter with Static Inputs

作　　者：刘涛[1,2] 岂飞涛[1,2] 朱蓓丽 张琳 刘海南 滕瑞[1,2] 李博[1,2] 赵发展 罗家俊[1,2] 韩郑生[1,2,3] LIU Tao;QI Feitao;ZHU Beili;ZHANG Lin;LIU Hainan;TENG Rui;LI Bo;ZHAO Fazhan;LUO Jiajun;HAN Zhengsheng(Institute of Microelec.,Chinese Academy of Sci.,Beijing 100029,P.R.China;Key Lab.of Sci.and Technol.on Silicon Dev.,Chinese Academy of Sci.,Beijing 100029,P.R.China;Univ.of Chinese Academy of Sci.,Beijing 100049,P.R.China)

机构地区：[1]中国科学院微电子研究所,北京100029 [2]中国科学院硅器件技术重点实验室,北京100029 [3]中国科学院大学,北京100049

出　　处：《微电子学》2022年第2期329-333,共5页Microelectronics

摘　　要：采用静态输入检测技术,提出并实现了一个模数转换器(ADC)单粒子效应评估测试系统。该系统基于面向仪器系统的外围组件互联扩展平台(PXI)搭建。利用PXI触发模式控制模块化仪器的高速响应,并采用实时判决的方法对ADC输出数据进行监测。基于该系统对一种自主研发的10位25 MS/s ADC进行单粒子效应辐照试验。试验结果表明,该系统能够准确、高效评估ADC抗辐照性能,为抗辐照ADC的加固设计提供支撑平台。A single event effect test system for analog-to-digital converter(ADC) with static inputs was proposed. The system was built on NI’s Peripheral Component Interconnection Extensions for Instrumentation platform(PXI). By applying trigger mode, the different instrument modules in PXI platform could cooperate and respond in high frequency. By applying continuous data capture and real-time comparison with expected value, the system could observe and store outputs beyond ADC’s error-band window. Based on this system, a single event effect radiation experiment was carried out upon a self-developed 10 bit 25 MS/s ADC. The result showed that the system could precisely capture sensitive data, which provide comprehensive data services for single event effect measurement and radiation-hardened design of ADC.

关 键 词：ADC 单粒子效应 PXI 

分 类 号：TN792[电子电信—电路与系统]