利用迈克耳孙干涉仪测量滤光片特性参数  

Using Michelson interferometer to measure the characteristic parameters of optical filter

作　　者：高崇涵 安炜 王峥[1] 徐平[1] GAO Chong-han;AN Wei;WANG Zheng;XU Ping(Sino-French Engineer School,Beihang University,Beijing 100191,China)

机构地区：[1]北京航空航天大学中法工程师学院,北京100191

出　　处：《大学物理》2022年第8期81-85,共5页College Physics

基　　金：国家自然科学基金(11804015)资助。

摘　　要：滤光片是一种能够从白光或其他复色光中分选出一定波长范围光的光学元件,其主要参数为中心波长和带宽.本文利用迈克耳孙干涉仪搭建了傅里叶变换光谱仪,测量了窄带滤光片的特性参数,并和传统的衍射光栅法进行了对比分析.使用迈克耳孙干涉仪搭建的傅里叶变换光谱仪获得光谱的过程无需已知光谱灯的校准,得到的窄带滤光片特性参数更为精确,且能够更加综合地锻炼学生的实验能力.Optical filter is an optical element that can select a certain wavelength range from white light,and is widely used in photography and detection systems.Its main parameters are central wavelength and bandwidth.In this paper,a Michelson interferometer is used to measure the characteristic parameters of narrow-band filter based on the Fourier transform principle.The measurement results are compared with the traditional diffraction grating method.It is found that the measurement done by Michelson interferometer does not need the calibration of the Mercury lamp and the results are more accurate than the traditional diffraction grating method.Moreover,the present method could improve students ability of solving practical problems by using multi-disciplinary knowledge comprehensively.

关 键 词：滤光片 傅里叶变换光谱仪 迈克耳孙干涉仪 

分 类 号：O4-34[理学—物理]