基于吸收光谱技术的制冷剂膜厚测量系统研制  

Development of Measurement System of Refrigerant Film Thickness Based on Absorption Spectroscopy

作　　者：孔帅帅 许晓妍 孙昊 方奕栋[1] 苏明旭[1] 杨荟楠 Kong Shuaishuai;Xu Xiaoyan;Sun Hao;Fang Yidong;Su Mingxu;Yang Huinan(School of Energy and Poicer Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China)

机构地区：[1]上海理工大学能源与动力工程学院,上海200093

出　　处：《中国激光》2022年第17期59-64,共6页Chinese Journal of Lasers

基　　金：国家自然科学基金(51676130);上海市自然科学基金(20ZR1438900)。

摘　　要：制冷剂液膜蒸发现象广泛地存在于航空航天、制冷空调和消费电子等领域,高精度定量分析液膜厚度对于了解液膜分布情况、揭示液膜传热规律及优化相关工业过程至关重要。将R1233zd作为研究对象,提出一种基于吸收光谱技术的制冷剂液膜厚度测量新方法。首先获取了不同温度(11.8,13.5,15.2,16.5,18.0℃)下R1233zd的吸收光谱,构建液膜厚度反演模型,并研制膜厚测量系统。利用厚度可调(0~800μm)的标准具对该系统的测量精度进行验证。进一步结合图像法对水平石英玻璃板上的R1233zd液膜蒸发过程进行研究,发现两种方法测得的液膜厚度随时间的变化趋势吻合良好。该系统实现了R1233zd液膜蒸发过程中膜厚的高精度测量,有望为相关工业过程的设计和优化提供数据支撑。Objective The evaporation of refrigerant films is common in aviation and aerospace,refrigeration and air-conditioning,and other industries.Film thickness measurement helps understand the heat transfer mechanisms of liquid films during the formation,flow,and evaporation processes.Several researchers have worked on numerical simulations of refrigerant films.However,because numerical simulations are often based on simplified assumptions,the simulation results are less credible.Meanwhile,a large number of experiments on the measurement of liquid film thickness have been performed using various methods,including electrical,acoustic,and optical methods,but the work relevant to refrigerant films is relatively limited.The capacitive method,optical interferometry,and imaging method have been used to investigate the refrigerant liquid film.However,the above-mentioned methods have certain limitations.Measurement of refrigerant film thickness cannot be performed with high accuracy.Therefore,a novel refrigerant film thickness measurement system based on absorption spectroscopy is proposed.It demonstrates that high-accuracy thickness measurement is possible.This system can provide scientific guidance for the design and optimization of relevant industrial devices and processes.Methods In the study,R1233zd is used as the refrigerant.The absorption spectra in the near-infrared region(5800.0-6300.0 cm-1)of R1233zd at different temperatures(11.8,13.5,15.2,16.5,18.0℃)below the boiling point are measured using a self-designed temperature control device with high precision and a Fourier-transform infrared spectrometer with high resolution(Fig.2).Based on the Beer-Lambert law,two wavenumber positions(υ1 andυ2)are chosen to eliminate the influence of light intensity attenuation caused by other factors.The absorption coefficient is significant atυ1 and close to zero atυ2.The absorption coefficients at these two wavenumber positions should be nearly temperature independent.An inversion model is developed,which is also applicable to

关 键 词：测量 吸收光谱 膜厚 蒸发 

分 类 号：TK31[动力工程及工程热物理—热能工程]