电子产品综合应力沙尘试验方法研究  

Study on Comprehensive Stress Sand Dust Test Method of Electronic Products

作　　者：江徽 刘信 何静 万永康 虞勇坚[1] 张凯虹[1] JIANG Hui;LIU Xin;WANG Yong-kang;YU Yong-jian;ZHANG Kai-hong(China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214035)

机构地区：[1]中国电子科技集团公司第五十八研究所,无锡214035

出　　处：《环境技术》2022年第5期36-40,45,共6页Environmental Technology

摘　　要：本文研究了一种电子产品综合应力沙尘试验评价方法。该方法基于产品的实际应用环境特点与沙尘应力同其它环境因素的耦合效应,引入了温度应力形成综合应力条件,开展了电子产品综合应力沙尘试验方法的研究,并给出了综合应力试验严酷度选择方法以及试验后产品的性能表征与风险等级判定方法,为评价电子产品综合沙尘应力条件下的可靠性提供指导。A comprehensive stress sand dust test evaluation method for electronic products is studied in this paper.Based on the practical application environment characteristics of the product and the coupling effect of sand and dust stress and other environmental factors,this method introduces the comprehensive stress condition for the formation of temperature stress,carries out the research on the comprehensive stress sand and dust test method for electronic products,and gives the selection method of the severity of the comprehensive stress test,as well as the performance characterization and risk grade determination method of the product after the test,It provides guidance for evaluating the reliability of electronic products under the condition of comprehensive sand and dust stress.

关 键 词：综合应力 沙尘试验 风险等级 可靠性 

分 类 号：X192[环境科学与工程—环境科学]