基于FPGA的COTS器件辐射效应测试系统  

Radiation Effect Test System for COTS Devices Based on FPGA

作　　者：买梓奇 李宏伟 朱翔 韩建伟 赵旭 Mai Ziqi;Li Hongwei;Zhu Xiang;Han Jianwei;Zhao Xu(State Key Laboratory of Space Weather,National Space Science Center,Chinese Academy of Sciences,Beijing 100190,China;School of Electronic Electrical and Communication Engineering,University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]中国科学院国家空间科学中心空间天气学国家重点实验室,北京100190 [2]中国科学院大学电子电气与通信工程学院,北京100049

出　　处：《半导体技术》2023年第4期340-346,共7页Semiconductor Technology

摘　　要：为了满足航天商业现货(COTS)器件辐射效应评估的高效率、低成本、批量测试需求,通过分析典型COTS器件不同辐射效应测试的异同,设计了COTS器件通用辐射效应测试系统。测试系统由面向仪器系统的外围组件互连(PCI)扩展(PXI)系统和基于现场可编程门阵列(FPGA)的监测主板组成,适用于FPGA、模数转换器(ADC)、静态随机存储器(SRAM)、运算放大器、电源芯片等典型COTS器件单粒子和总剂量效应地面模拟试验,能够在线实时测量被测器件的功耗电流、逻辑功能、输出信号等参数,可对被测器件的输入电压、输入电流、输出电压等需要高精度测量的功能性能参数进行离线测量。通过典型器件的单粒子与总剂量效应试验,对测试系统的在线与离线测试功能进行了验证,结果表明该测试系统能够满足测试需求。In order to meet the requirements of high efficiency,low cost and batch testing for radiation effect evaluation of aerospace commercial off-the-shelf(COTS)devices,a general radiation effect test system for COTS devices was designed by analyzing the similarities and differences of different radiation effect tests of typical COTS devices.The test system is composed of peripheral component interconnect(PCI)extensions for instrumentation(PXI)system and field programmable gate array(FPGA)-based monitoring mainboard.It is applicable to the ground simulation test of single event effect and total ionizing dose effect of typical COTS devices such as FPGA,analog-to-digital converter(ADC),static random access memory(SRAM),operational amplifier,power chip,etc.It can measure the power consumption current,logic function,output signal and other parameters of the device under test in real time online,and can measure the input voltage,input current,output voltage and other functional performance parameters requiring high-precision measurement shall be measured offline.Through the single event and total ionizing dose effect tests of typical devices,the online and offline test functions of the test system were verified,which shows that the test system can meet the test requirements.

关 键 词：单粒子效应 总剂量效应 辐射效应 现场可编程门阵列(FPGA) 商业现货(COTS)器件 

分 类 号：TN407[电子电信—微电子学与固体电子学]