基于ZYNQ的通用集成电路测试系统设计  

Design of Universal Integrated Circuit Test System Based on ZYNQ

作　　者：魏江杰 张竣昊 孙碧垚 WEI Jiangjie;ZHANG Junhao;SUN Biyao(CETC Shentai Information Technology Co.,Ltd.,Jiangsu 214125,China)

机构地区：[1]中电科申泰信息科技有限公司,江苏214125

出　　处：《集成电路应用》2023年第7期28-30,共3页Application of IC

摘　　要：阐述基于ZYNQ的通用集成电路测试系统设计,可以根据集成电路的实际需求,满足集成电路在扫描链功能测试、通用接口通信功能测试的双重需求,可以实现对多种通用芯片的关键参数进行测试。在测试阶段,降低了测试成本,系统有比较好的复用性。This paper describes the design of universal integrated In-circuit testing system based on ZYNQ, which can meet the dual requirements of integrated circuit function test in scan chain and universal interface communication function test according to the actual requirements of integrated circuits, and can test the key parameters of a variety of universal chips. During the testing phase, the testing cost was reduced and the system has good reusability.

关 键 词：集成电路测试 ZYNQ 扫描链 复用性 

分 类 号：TN407[电子电信—微电子学与固体电子学]