一种基于存储器内建自测试的新型动态March算法设计  

Design of Novel Dynamic March Algorithm Based on Memory Built-in Self-test

作　　者：蔡志匡[1] 余昊杰 杨航 王子轩[1] 郭宇锋[1] CAI Zhikuang;YU Haojie;YANG Hang;WANG Zixuan;GUO Yufeng(College of Integrated Circuit Science and Engineering,Nanjing University of Posts and Telecommunications,Nanjing 210023,China)

机构地区：[1]南京邮电大学集成电路科学与工程学院,南京210023

出　　处：《电子与信息学报》2023年第9期3420-3429,共10页Journal of Electronics & Information Technology

基　　金：国家重点研发计划(2018YFB2202005);国家自然科学基金(61974073);江苏省研究生科研与实践创新计划项目(SJCX21_0272)。

摘　　要：存储器作为片上系统(SoC)中最大和最重要的模块之一,它的稳定性和可靠性关乎着整个芯片能否正常工作。为了提高存储器的测试效率,该文提出一种新型动态March算法——Dynamic-RAWC。相比经典的March RAW算法,Dynamic-RAWC算法有着更良好的故障检测效果:动态故障覆盖率提高了31.3%。这个可观的效果得益于所提算法以经典的March RAW算法为基础进行优化,融入了Hammer,March C+算法的测试元素和一些新的测试元素。不同于普通March型算法的固定元素,所提算法支持用户自定义算法的执行顺序以适应不同的故障检测需求,能够动态地控制算法元素,在时间复杂度和故障覆盖率之间进行调整从而达到良好的平衡。As the largest module and one of the most important modules in the System on Chip(SoC),the stability and reliability of memory are related to whether the whole chip can work normally.In order to improve the test efficiency of memory,a novel Dynamic March algorithm—Dynamic-RAWC is proposed.The fault detection effect of the Dynamic-RAWC algorithm is better than that of the classic March RAW algorithm:the dynamic fault coverage is increased by 31.3%.This considerable effect is due to the fact that the test elements of Hammer,March C+algorithm and some new test elements are integrated into the proposed algorithm which is optimized based on the classic March RAW algorithm.In contrast to ordinary March-type algorithms which have fixed elements,the proposed algorithm supports the user to customize the execution order of the algorithm to meet the detection needs of different faults model,and can dynamically switch the algorithm elements,adjusting between the time complexity and the fault coverage to achieve a good balance.

关 键 词：存储器内建自测试 MARCH算法 动态故障 故障覆盖率 

分 类 号：TN402[电子电信—微电子学与固体电子学]