高精度并联6-DOF测量机构的正解研究  

Positive Solution of High Accuracy 6-DOF Measurment Platform

作　　者：曲东明 刘曰涛[2] 韩振 边宗政 李自帅 Qu Dongming;Liu Yuetao;Han Zhen;Bian Zongzheng;Li Zishuai(School of Agricultural Engineering and Food Science,Shandong University of Science and Technology;School of Mechanical Engineering,Shandong University of Technology)

机构地区：[1]山东理工大学农业工程与食品科学学院 [2]山东理工大学机械工程学院

出　　处：《工具技术》2023年第8期137-141,共5页Tool Engineering

基　　金：国家自然科学基金(51805299)。

摘　　要：并联六自由度平台可达到微米级的测量效果,针对此类Stewart平台传统位置正解计算时间长、精度低等问题,提出一种区间分析和遗传算法相结合的求解方法,弥补了迭代过程中难以获取初始解以及迭代结果易发散的问题。对比相同实例的区间分析—遗传算法与牛顿迭代法计算结果,数据表明:区间分析与遗传算法的结合缩短了正解运算时间,平台整体响应速度提高约40%,使平台能达到7μm的重复定位精度,能更好地满足实际使用要求。Parallel 6-DOF platforms can achieve micron-level measurement results.Aiming at the problems of long calculation time and low accuracy of traditional positive solutions for such Stewart platforms,a solution method combining interval analysis and genetic algorithm are proposed.It makes up for the problem that it is difficult to obtain the initial solution during the iteration process and the iterative results are easy to diverge.Comparing the calculation results of interval analysis-genetic algorithm and Newton iteration method under the same instance,the data shows that interval analysis-genetic algorithm shortens the calculation time of positive solution,increases the overall response speed of the platform by about 40%,and enables the platform to achieve 7 microns of repeated positioning accuracy can better meet the actual use.

关 键 词：STEWART平台 位置正解 区间分析—遗传算法 精度测量 

分 类 号：TG806[金属学及工艺—公差测量技术] TH702[机械工程—仪器科学与技术]