测试原语:存储器故障最小检测序列的统一特征  

Test Primitive:Unified Features of Minimal Test Sequence for Memory Faults

作　　者：肖寅东[1] 王恩笙 路杉杉 戴志坚[1] XIAO Yindong;WANG Ensheng;LU Shanshan;DAI Zhijian(School of Automation Engineering,University of Electronic Science and Technology of China,Chengdu 611731,China)

机构地区：[1]电子科技大学自动化工程学院,成都611731

出　　处：《电子与封装》2023年第12期1-8,共8页Electronics & Packaging

摘　　要：March算法作为一类高效的存储器测试算法,已在学术界得到广泛、深入的研究,并取得了卓越成果。然而,当前以故障原语为核心的故障建模方法无法直接应用于March算法的分析。提出了一种新的测试原语,将其作为故障原语与March算法之间的桥梁,以期简化测试算法的分析、生成过程。该测试原语描述了March算法检测对应故障所必须具备的共性特征,形成了高度灵活且可拓展的March算法分析单元。根据故障原语生成了对应的测试原语,通过理论分析证明了该测试原语具有完备性、唯一性和简洁性的特点。As an efficient class of memory test algorithms,March algorithms have been extensively and thoroughly studied in academia,and have achieved excellent results.However,the current fault modeling methods centered on fault primitives cannot be directly applied to the analysis of March algorithms.A new test primitive is proposed as a bridge between the fault primitives and March algorithms in order to simplify the test algorithm analysis and generation.The test primitive describes the common features those March algorithms must have to detect corresponding faults,forming a highly flexible and extensible unit of analysis for March algorithms.According to fault primitives,corresponding test primitives are generated,which are proved to be characterized by completeness,uniqueness and conciseness through theoretical analysis.

关 键 词：MARCH算法 故障原语 测试原语 

分 类 号：TN407[电子电信—微电子学与固体电子学]