基于新型BIST的LUT测试方法研究  

Research on LUT testing method based on new BIST

作　　者：林晓会 解维坤[1] 宋国栋[1] LIN Xiaohui;XIE Weikun;SONG Guodong(China Electronic Technology Group Corporation No.58 Research Institute,Wuxi 214035,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《现代电子技术》2024年第4期23-27,共5页Modern Electronics Technique

摘　　要：针对FPGA内部的LUT资源覆盖测试,提出一种新型BIST的测试方法。通过改进的LFSR实现了全地址的伪随机向量输入,利用构造的黄金模块电路与被测模块进行输出比较,实现对被测模块功能的快速测试,并在Vivado 2018.3中完成了仿真测试。通过ATE测试平台,加载设计的BIST测试向量,验证结果与仿真完全一致,仅2次配置即可实现LUT的100%覆盖率测试。此外,还构建了LUT故障注入模拟电路,人为控制被测模块的输入故障,通过新型BIST的测试方法有效诊断出被测模块功能异常,实现了准确识别。以上结果表明,该方法不仅降低了测试配置次数,而且能够准确识别LUT功能故障,适用于大规模量产测试。For the LUT resource coverage test inside FPGA,a new BSIT testing method is proposed.The pseudo-random vector input of the full address is realized by means of the improved LFSR,and the rapid test of the function of the tested module is realized by comparing the constructed golden module circuit with the output of the tested module,and the simulation test is completed in Vivado 2018.3.By means of the ATE testing platform,the designed BIST test vector is loaded,and that the verification results are completely consistent with the simulation.Only two configurations can realize the 100%coverage testing of LUT.A LUT fault injection simulation circuit is constructed to artificially control the input fault of the tested module.The new BIST testing method is used to effectively diagnose the functional abnormalities of the tested module and realize accurate identification.The above results indicate that this method can not only reduce the number of test configurations,but also accurately identify LUT functional faults,making it suitable for large-scale production testing.

关 键 词：查找表 内建自测试 FPGA 故障注入 线性反馈移位寄存器 自动测试设备 

分 类 号：TN710-34[电子电信—电路与系统]