集成X射线、TEM和STM的晶体学教学尝试  

Integrated Crystallographic Teaching with X-ray,TEM and STM

作　　者：马宏伟 张芳 艾惠 张妞 彭绍春 李晖[2] Hongwei Ma;Fang Zhang;Hui Ai;Niu Zhang;Shaochun Peng;Hui Li(Analysis and Testing Center,Beijing Institute of Technology,Beijing 122488,China;School of Chemistry and Chemical Engineering,Beijing Institute of Technology,Beijing 122488,China)

机构地区：[1]北京理工大学分析测试中心,北京122488 [2]北京理工大学化学化工学院,北京122488

出　　处：《大学化学》2024年第3期5-17,共13页University Chemistry

基　　金：国家自然科学基金(21471017)。

摘　　要：以Si晶体为例,介绍了一种结合X-射线、电子显微学和扫描隧道显微技术进行晶体学教学的尝试。主要是从基本原理、实验技术、实验结果等方面建立不同方法之间的联系,也说明其区别。目的是使学生能依据基本的晶体学原理、概念和数据,理解不同的晶体结构分析和表征方法提供的晶体学信息之间的区别和联系,达到融会贯通的效果。Using Si crystals as an illustrative example,an integrated approach to teaching crystallography with Xray/electron diffraction and TEM/STM imaging,including the principles,technologies and results,was presented to help students building up the links among different crystallographic methods and technologies for structure characterization,so that they have a complete and integrated understanding of crystallographic concepts,theories and the results from different technologies.

关 键 词：晶体学 教学 X-射线 TEM STM 

分 类 号：G64[文化科学—高等教育学] O641[文化科学—教育学]