一种高速时钟分配电路单粒子效应测试系统设计  

Design of single event effect testing system for high speed clock allocation circuits

作　　者：魏亚峰 蒋伟 陈启明[2] 孙毅 刘杰[4] 李曦 张磊 WEI Yafeng;JIANG Wei;CHEN Qiming;SUN Yi;LIU Jie;LI Xi;ZHANG Lei(College Chongqing GigaChip Technology Co.,Ltd.,Chongqing 400060,China;Institute China Institute of Atomic Energy,Beijing 102400,China;Beijing Satellite Environmental Engineering Research Institute,Beijing 102400,China;Lanzhou Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000,China)

机构地区：[1]重庆吉芯科技有限公司,重庆400060 [2]中国原子能科学研究院,北京102400 [3]北京卫星环境工程研究所,北京102400 [4]中国科学院兰州近代物理研究所,甘肃兰州730000

出　　处：《现代电子技术》2024年第10期57-63,共7页Modern Electronics Technique

摘　　要：时钟分配电路是电子系统中信号处理单元参考时钟及多路时钟分配的关键元器件,其跟随系统在宇宙空间中容易受宇宙射线辐照发生单粒子效应,进而影响系统性能指标甚至基本功能。为此,提出一种针对数字单元翻转的微测试方法,结合分段存储技术完成高速时钟分配电路的单粒子效应的在线测试系统设计。另外,在HI-13串列加速器与HIRFL回旋加速器上进行了试验验证,成功监测到单粒子翻转、单粒子功能中断等典型单粒子效应。最后根据试验数据并结合FOM方法进行了电路在轨故障率推算,这对于集成电路研制阶段的测试评估与应用阶段的系统验证都有重要意义。The clock distribution circuit is a key component for signal processing unit reference clock and multi-channel clock distribution in electronic systems.Its tracking system is prone to single event effects(SEE)caused by cosmic ray irradiation in space,which can affect system performance indicators and even basic functions.On this basis,a micro testing method for digital single-event upsets(SEU)is proposed,and an online testing system for SEE in high-speed clock allocation circuits is designed by combing with segmented storage technology.The experimental verification is conducted on both the HI-13 and the HIRFL.The typical single event testing effects such as SEU,single-event functional interrupt(SEFI)and single-event latch up(SEL)are monitored successfully.The circuit in orbit failure rate was calculated by means of FOM method and experimental data,which is of great significance for the testing and evaluation during the development phase of integrated circuits and the system validation during the application phase.

关 键 词：单粒子效应 时钟分配电路 HI-13串列加速器 HIRFL回旋加速器 单粒子锁定 单粒子翻转 

分 类 号：TN47-34[电子电信—微电子学与固体电子学]