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作 者:玛丽娅·黑尼 李豫东 王信[1,2,3] 何承发 郭旗[1,2,3] MALIYA Heini;LI Yudong;WANG Xin;HE Chengfa;GUO Qi(Key Laboratory of Functional Materials and Devices for Special Environments,Urumqi 830011,China;Xinjiang Key Laboratory of Extreme Environment Electronics,Urumqi 830011,China;Xinjiang Technical Institute of Physics and Chemistry of Chinese Academy of Sciences,Urumqi 830011,China)
机构地区:[1]特殊环境条件功能材料与器件全国重点实验室,乌鲁木齐830011 [2]新疆极端环境电子学重点实验室,乌鲁木齐830011 [3]中国科学院新疆理化技术研究所,乌鲁木齐830011
出 处:《现代应用物理》2024年第4期96-102,115,共8页Modern Applied Physics
基 金:国家自然科学基金资助项目(12205367);新疆维吾尔自治区“天山英才培养”计划资助项目(2023TSYCCX0045);新疆电子信息材料与器件实验室资助项目(2021D04012)。
摘 要:激光器、探测器等光通信器件对空间辐射环境中高能粒子引入的位移损伤敏感,且随时间累积不可恢复。针对光通信用垂直腔面发射激光器和光电二极管开展了质子辐照试验,并对辐照前后器件的光功率-电流-电压曲线、阈值电流、低频噪声等参数进行了测试分析。研究结果表明:由于质子辐照后,载流子被辐射感生缺陷形成的非辐射复合中心捕获,降低了少数载流子的寿命,复合产生的光子数量减少,因此850 nm垂直腔面发射激光器在质子辐照后光输出功率、外量子效率随注量的增加而降低;InGaAs光电二极管暗电流和噪声密度谱增加。Optical communication devices such as lasers and detectors are sensitive to the displacement damage introduced by energetic particles in the space radiation environment and cannot recover with time.The proton irradiation test is carried out for the vertical cavity surface emitting laser and photodiode for optical communication.The parameters of optical power-current-voltage curve,threshold current,and low frequency noise of the device before and after irradiation are tested and analyzed.The results show that the carrier is captured by the non-radiation composite center formed by the radiation induced defect,which reduces the life of the minority carriers and the number of photons produced by the combination after proton irradiation.The light output power of the 850 nm laser decreases with the increase of proton irradiation and the dark current and noise density spectrum of InGaAs photodiode increase.
关 键 词:位移损伤 垂直腔面发射激光器 InGaAs光电二极管 阈值电流 暗电流
分 类 号:TL99[核科学技术—核技术及应用] TN29[电子电信—物理电子学]
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