离散量采集模块自测试电路故障分析  

Discrete Acquisition Module Self-test Circuit Failure Analysis

作　　者：郭警涛[1] 唐铂 程博 蔡云姗 Guo Jingtao;Tang Bo;Cheng Bo;Cai Yunshan(Xi’an Aeronautic Computing Technique Research Institute,AVIC,Xi’an Shaanxi 710065,China;The Sixth Military Representative Office of the Air Force Armament Department in Xi’an,Xi’an Shaanxi 710065,China)

机构地区：[1]航空工业西安航空计算技术研究所,陕西西安710065 [2]空装驻西安地区第六军事代表室,陕西西安710065

出　　处：《山西电子技术》2024年第6期12-14,47,共4页Shanxi Electronic Technology

摘　　要：对离散量采集模块上电自测试电路故障进行了分析定位,该故障仅导致离散量输入信号自测试错误,不影响正常采集电路功能。通过数据采集分析,将故障定位为干扰触发了自测试电路中开关器件的闩锁,造成故障。对自测试电路进行改进,通过试验验证,改进后的措施有效,可解决故障问题。The power-on self-test circuit fault of the discrete acquisition module is analyzed and located,which only leads to the error of the discrete input signal self-test,and does not affect the normal acquisition circuit function.Through data acquisition and analysis,it locates that the fault is coused by interference triggering the latch-up of the switching device in the self-test circuit.The self-test circuit is improved,and the improved measures are effective and can solve the fault problem through test verification.

关 键 词：离散量采集 自测试 闩锁 

分 类 号：TP368.2[自动化与计算机技术—计算机系统结构]