基于小角X射线散射技术测定淀粉结构研究进展  

Research Progress on Determination of Starch Structure Based on Small Angle X-Ray Scattering Technique

作　　者：石长波[1] 徐朔 凌衍东 杨江江 金美琳 赵钜阳 SHI Chang-bo;XU Shuo;LING Yan-dong;YANG Jiang-jiang;JIN Mei-lin;ZHAO Ju-yang(College of Tourism and Cuisine,Harbin University of Commerce,Harbin 150028,China)

机构地区：[1]哈尔滨商业大学旅游烹饪学院,哈尔滨150028

出　　处：《中国调味品》2025年第3期223-226,240,共5页China Condiment

基　　金：黑龙江省自然科学博士后基金面上项目(LBH-Z22204);黑龙江省自然科学基金(LH2024C068)。

摘　　要：小角X射线散射技术在食品领域是一门重要技术,它可以测试薄膜、块体、粉体、液体、流体等样品的结构特征而不改变其形态。文章浅析了小角X射线散射原理,阐述了其在淀粉结构中的应用,通过对数据拟合和分析以及相关参数表征淀粉粒子形状、平均界面层厚度、分形维数等方面的研究进展进行综述,以期为采用小角X射线散射技术测定其他食品结构提供理论依据及参考。Small angle X-ray scattering technique is an important technique in the field of food,which can test the structural characteristics of samples such as thin films,bulk,powder,liquid,fluid and so on without changing their morphology.In this paper,the principle of small angle X-ray scattering is briefly analyzed,and its application in starch structure is described.The research progress on data fitting and analysis,the characterization of starch particle shape,average interface layer thickness and fractal dimension by relevant parameters is reviewed,so as to provide theoretical basis and references for the determination of other food structure by small angle X-ray scattering technique.

关 键 词：小角X射线散射 淀粉 淀粉结构 

分 类 号：TS234[轻工技术与工程—粮食、油脂及植物蛋白工程]