模拟开关通用测试系统研究  

Research of the Generalized Testing System for Analog Switch

作　　者：钟昂 戴畅 ZHONG Ang;DAI Chang(China Electronics Technology Group Corporation No.24 Research Institute,Chongqing 400060,China)

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《电子与封装》2025年第4期39-47,共9页Electronics & Packaging

摘　　要：传统模拟开关测试系统存在开发周期长、部分参数测试精度不够的通用问题,逐渐无法满足当前高性能器件大批量生产测试的要求。利用共用母板的兼容性和大型测试机台的精准性、稳定性,设计了一套基于V93000自动测试设备的模拟开关通用测试系统,该系统可调性强、兼容性广、精度高,且易于操作,新产品测试开发时只需经过简单的硬件设计,并通过简单的可视化窗口软件调试即可,大大缩短了模拟开关类器件测试系统的开发周期,提高了效率,降低了测试成本,并保证了测试参数的准确性和稳定性。The traditional analog switch testing system has common issues such as long development cycles and insufficient testing precision of some parameters,which gradually fails to meet the current requirements of mass production testing for high-performance devices.Using the compatibility of the common motherboard and the accuracy and stability of the large-scale test equipment,a general testing system for analog switch based on V93000 automatic test equipment is designed.The system has strong adjustability,wide compatibility,high accuracy,and is easy to operate.When testing and developing new products,only simple hardware design and visual window software debugging are needed,which can greatly shorten the development cycle of the analog switch device testing system,improve efficiency,reduce costs,and ensure the accuracy and stability of testing parameters.

关 键 词：测试系统 模拟开关 自动测试设备 硬件设计 

分 类 号：TN407[电子电信—微电子学与固体电子学]