内建自测试中移位器的设计及其应用(英文)  

Design and Applications of Phase Shifters in BIST

作　　者：毛武晋[1] 王澍[1] 杨军[1] 许舸夫[1] 

机构地区：[1]东南大学国家集成电路系统工程中心,南京市210096

出　　处：《电子器件》2002年第4期444-447,共4页Chinese Journal of Electron Devices

摘　　要：本文提出了一种新的方法和综合技术用来去除多扫描链内建测试中由线形反馈移位寄存器引起的测试向量线性关联性。利用本方法可以高效的设计内建自测试中移位器并且保证足够扫描链间的位移和每条扫描通道尽少量的门数开销。This paper presents new design and synthesis techniques that remove effects of linear dependencies of subsequences generated by linear feedback shift registers (LFSR) driving parallel scan chains. As shown in the paper, it is possible to synthesize very large and fast phase shifters for BIST applications with guaranteed phaseshifts between scan chains and very small number of gates per channel.

关 键 词：内建自测试 移位器 转置线形反馈移位寄存器 扫描链 

分 类 号：TP332.11[自动化与计算机技术—计算机系统结构]