ACKNOWLEDGMENTS This work was supported by the National Natural Science Foundation of China (No.11275024) and the Ministry of Science and Technology of China (No.2013YQ03059503 and No.2011AA120101). The authors would like to thank Prof. R. W. M. Kwok from the Chinese University of Hong Kong.
The irradiation effects of Ar+, He+, and S+ with energy from 10 eV to 180 eV on n-InP(100) surface are analyzed by X-ray photoelectron spectroscopy and low energy electron diffraction. After irradiation on the n-...
supported by the National Natural Science Foundation of China (10835010,10675150,10175084);the National Basic Research Program of China (2010CB832902)
The structural stability of C60 films under the bombardment of 1.95 GeV Kr ions is investigated.The irradiated C60 films were analyzed by Fourier Transform Infrared(FTIR) spectroscopy and Raman scattering technique.Th...
A durability test to determine anti-bombardment sensitivity of multi-RE2O3-Mo secondary emission material was carried out and the variation of maximum secondary emission coefficient (δ)max)) was monitored at regula...