supported by the National Natural Science Foundation of China(No.61404115,No.61434006);the Postdoctoral Science Foundation of Henan Province(No.2014006)
PMGI/ZEP520A/PMGI/ZEP520 A fourlayer resist stack is firstly proposed for T-gates fabrication of InP-based High electron mobility transistors(HEMTs).Gate-head and gate-foot are exposed in single-step Electron beam lit...
supported by the National Natural Science Foundation of China(No.61404115,No.61434006);the Postdoctoral Science Foundation of Henan Province(No.2014006)
T-Gate fabrication processes for In P-based High electron mobility transistors(HEMTs) are described using PMMA/Al/UVIII. The single-step and two-step Electron beam lithography(EBL) methods are proposed contrastively w...