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Direct observation of ultrafast magnetization dynamics in Co/Ni bit patterned media by time-resolved scanning Kerr microscopy
《Chinese Physics B》2025年第4期579-583,共5页Wei Zhang Wei He Qin-Li Lv Jian-Wang Cai Xiang-Qun Zhang Zhao-Hua Cheng 
Project supported by the National Key Research and Development Program of China(Grant No.2022YFA1403302);the National Natural Science Foundation of China(Grant Nos.52031015,U22A20115,and 12104030);the Natural Science Foundation of Zhejiang Province,China(Grant No.LZ25A040007);the Natural Science Foundation of Beijing(Grant No.1252026).
Bit patterned recording(BPR)has attracted much attention due to its promising potential in achieving high densities in magnetic storage devices.The materials with strong perpendicular magnetic anisotropy(PMA)are alway...
关键词：ultrafast spin dynamics magneto-optical Kerr effect micromagnetic simulations 
Physics through the microscope
《Chinese Physics B》2024年第11期1-11,共11页Stephen J.Pennycook Ryo Ishikawa Haijun Wu Xiaoxu Zhao Changjian Li Duane Loh Jiadong Dan Wu Zhou 
The electron microscope provides numerous insights into physics, from demonstrations of fundamental quantummechanical principles to the physics of imaging and materials. It reveals the atomic and electronic structure ...
关键词：scanning transmission electron microscopy materials science point defects artificial intelligence 
Making the link between ADF and 4D STEM:Resolution,transfer and coherence
《Chinese Physics B》2024年第11期26-33,共8页Peter D.Nellist Timothy J.Pennycook 
funding from the European Research Council(ERC)under the European Union’s Horizon 2020 Research and Innovation Programme via Grant Agreement No.802123-HDEM(TJP);from the UK Engineering and Physical Sciences Research Council(EPSRC)via grant EP/M010708/1(PDN).
Steve Pennycook is a pioneer in the application of high-resolution scanning transmission electron microscopy(STEM)and in particular the use of annular dark-field(ADF)imaging.Here we show how a general framework for 4D...
关键词：image forming and processing phase retrieval electron microscopy scanning transmission electron microscope(STEM) 
Real-time four-dimensional scanning transmission electron microscopy through sparse sampling被引量：1
《Chinese Physics B》2024年第11期34-38,共5页A W Robinson J Wells A Moshtaghpour D Nicholls C Huang A Velazco-Torrejon G Nicotra A I Kirkland N D Browning 无 
the Royal Society for providing funding under grant number EGR10965。
Four-dimensional scanning transmission electron microscopy(4-D STEM)is a state-of-the-art image acquisition mode used to reveal high and low mass elements at atomic resolution.The acquisition of the electron momenta a...
关键词：compressive sensing 4-D STEM INPAINTING 
Visualizing extended defects at the atomic level in a Bi_(2)Sr_(2)CaCu_(2)O8_(+σ) superconducting wire
《Chinese Physics B》2024年第9期43-47,共5页Kejun Hu Shuai Wang Boyu Li Ying Liu Binghui Ge Dongsheng Song 
The microstructure significantly influences the superconducting properties.Herein,the defect structures and atomic arrangements in high-temperature Bi_(2)Sr_(2)CaCu_(2)O8_(+σ) superconducting wire are directly charac...
关键词：SUPERCONDUCTOR microstructure DEFECT scanning transmission electron microscopy 
Atomically self-healing of structural defects in monolayer WSe_(2)
《Chinese Physics B》2024年第9期49-55,共7页Kangshu Li Junxian Li Xiaocang Han Wu Zhou Xiaoxu Zhao 
the Beijing Natural Science Foundation(Grant Nos.JQ24010 and Z220020);the Fundamental Research Funds for the Central Universities,and the National Natural Science Foundation of China(Grant No.52273279);Project supported by the Electron Microscopy Laboratory of Peking University,China for the use of Nion U-HERMES200 scanning transmission electron microscopy.We thank Materials Processing and Analysis Center,Peking University,for assistance with TEM characterization.The electron microscopy work was through a user project at Center of Oak Ridge National Laboratory(ORNL)for Nanophase Materials Sciences(CNMS),which is a DOE Office of Science User Facility.
Minimizing disorder and defects is crucial for realizing the full potential of two-dimensional transition metal dichalcogenides(TMDs) materials and improving device performance to desired properties. However, the meth...
关键词：scanning transmission electron microscopy(STEM) atom manipulation nanoscale materials and structures:fabrication and characterization new materials:theory design FABRICATION 
Multiphase cooperation for multilevel strain accommodation in a single-crystalline BiFeO_(3) thin film
《Chinese Physics B》2024年第9期57-66,共10页Wooseon Choi Bumsu Park Jaejin Hwang Gyeongtak Han Sang-Hyeok Yang Hyeon Jun Lee Sung Su Lee Ji Young Jo Albina Y.Borisevich Hu Young Jeong Sang Ho Oh Jaekwang Lee Young-Min Kim 
Samsung Research Fundings&Incubation Center of Samsung Electronics(Grant No.SRFCMA1702-01);Y.-M.K acknowledges partial support from the National Research Foundation of Korea(NRF)(Grant No.2023R1A2C2002403)funded by the Korean government in Korea;A.Borisevich acknowledges support from FaCT,an Energy Frontier Research Center funded by the U.S.Department of Energy,Office of Science,Office of Basic Energy Science,Collaboratives Research Division.
The functionalities and diverse metastable phases of multiferroic BiFeO_(3)(BFO)thin films depend on the misfit strain.Although mixed phase-induced strain relaxation in multiphase BFO thin films is well known,it is un...
关键词：BiFeO_(3) scanning transmission electronmicroscopy electron holography multiferroic material strain mapping 
Multidimensional images and aberrations in STEM
《Chinese Physics B》2024年第9期68-74,共7页Eric R.Hoglund Andrew R.Lupini 
the U.S.Department of Energy,Office of Basic Energy Sciences(DOE-BES),Division of Materials Sciences and Engineering under contract ERKCS89.We acknowledge support for 4D-STEM performed as part of user proposal at the Center for Nanophase Materials Sciences(CNMS),which is a US Department of Energy,Office of Science,User Facility.Microscopy performed using instrumentation within ORNL’s Materials Characterization Core provided by UTBattelle,LLC,under Contract No.DE-AC05-00OR22725 with the DOE and sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory,managed by UT-Battelle,LLC,for the U.S.Department of Energy.
Recent advances in scanning transmission electron microscopy(STEM)have led to increased development of multidimensional STEM imaging modalities and novel image reconstruction methods.This interest arises because the m...
关键词：scanning transmission electron microscopy(STEM) ABERRATIONS 
Symmetry quantification and segmentation in STEM imaging through Zernike moments
《Chinese Physics B》2024年第8期39-48,共10页Jiadong Dan Cheng Zhang 赵晓续 N.Duane Loh 
funding support from the National Research Foundation (Competitive Research Program grant number NRF-CRP16-2015-05);the National University of Singapore Early Career Research Award;supported by the Eric and Wendy Schmidt AI in Science Postdoctoral Fellowship;a Schmidt Sciences program。
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy(STEM)images,aimed at improving structural analysis of materials at the atom...
关键词：scanning transmission electron microscopy(STEM) SYMMETRY SEGMENTATION 
Investigation of reflection anisotropy induced by micropipe defects on the surface of a 4H-SiC single crystal using scanning anisotropy microscopy
《Chinese Physics B》2024年第3期630-637,共8页黄威 俞金玲 刘雨 彭燕 王利军 梁平 陈堂胜 徐现刚 刘峰奇 陈涌海 
Project supported by the National Key Research and Development Program of China(Grant Nos.2018YFE0204001,2018YFA0209103,2016YFB0400101,and 2016YFB0402303);the National Natural Science Foundation of China(Grant Nos.61627822,61704121,61991430,and 62074036);Postdoctoral Research Program of Jiangsu Province(Grant No.2021K599C).
Optical reflection anisotropy microscopy mappings of micropipe defects on the surface of a 4H-SiC single crystal are studied by the scanning anisotropy microscopy(SAM)system.The reflection anisotropy(RA)image with a'b...
关键词：scanning anisotropy microscopy SiC reflection anisotropy edge dislocation 
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