Nowadays FinFET devices have replaced the MOS devices almost in all complex integrated circuits of electronic gadgets like computer peripherals, tablets, and smartphones in portable electronics. The scaling of FinFET ...
supported by the National Natural Science Foundation of China(Nos.61106080,61275042);the National Science and Technology Major Project of the Ministry of Science and Technology of China(No.2013ZX02305)
We investigate the effects of NO annealing and forming gas (FG) annealing on the electrical properties of a SiO2/SiC interface by low-temperature conductance measurements. With nitrogen passivation, the density of i...
The admittance measurements of a hetero-junction can be used to derive the density of the interfacial state in the hetero-junction. Hence, prediction conductance via frequency is very useful for comprehension of the a...
Project supported by the Fundamental Research Funds for the Central Universities of China (Nos.JUSRP111A42,JUSRP211A37,JUSRP20914,JUSRP11230);the State Key Laboratory of ASIC & System,China (No.11KF003);the Natural Science Foundation of Jiangsu Province,China (No.BK2012110)
The dispersion mechanism in Al0:27Ga0:73N/GaN heterostructure was investigated using frequencydependent capacitance and conductance measurements.It was found that the significant capacitance and conductance dispersi...
The transition of the barrier-type thyristor (BTH) from blocking to conducting-state occurs between two entirely contrary physical states with great disparity in nature. The physical effects and mechanisms of the tr...
A novel two-step method is employed, for the first time, to fabricatc nonvolatile memory devices that have metal nanoerystals. First, size-averaged Au nanocrystals are synthesized chemically; second, they are assemble...