氧分压对HfO_xN_y薄膜结构和力学性能的影响  

Effect of Oxygen Partial Pressure on the Structure and Mechanical Properties of HfO_xN_y Thin Films

作　　者：刘伟[1] 苏小平[1] 张树玉[1] 闫兰琴[1] 王宏斌[1] 刘嘉禾[1] 

机构地区：[1]北京有色金属研究总院北京国晶辉红外光学科技有限公司,北京100088

出　　处：《人工晶体学报》2009年第1期16-20,共5页Journal of Synthetic Crystals

摘　　要：采用射频磁控反应溅射法在不同氧分压条件下制备了氮氧化铪薄膜,薄膜沉积过程在氧气、氮气和氩气的混合气氛中进行,所用衬底为多光谱硫化锌材料。用X射线衍射、扫描电子显微镜、纳米硬度计等分别研究了不同氧分压条件下HfOxNy薄膜的晶体结构、显微结构、力学性能等。结果表明:在氧分压为0.05~0.30范围内,HfOxNy薄膜都为多晶结构,但随着氧分压的降低,HfOxNy薄膜的沉积速率逐渐增大,薄膜的晶体结构由单斜氧化铪转变为氮氧化铪相;不同氧分压下沉积的HfOxNy薄膜都符合薄膜区域结构模型中典型的柱状结构且氧分压较低时薄膜表面粗糙度较大;不同氧分压条件下沉积的HfOxNy薄膜硬度和弹性模量都远大于衬底硫化锌的硬度和弹性模量,氧分压为0.15时最大硬度和弹性模量值分别为11.6 GPa和160 GPa。HfOxNy thin films were deposited by RF reactive magnetron sputtering on multi-spectral ZnS substrates at different oxygen partial pressure.The depositions were carried out under an oxygen-nitrogen-argon atmosphere.Crystalline structure and microstructure of HfOxNy thin films were studied with X-ray diffraction(XRD) and scanning electron microscope(SEM).The hardness and modulus were tested by MTS Nano Indenter XP system.The results indicate that with the oxygen partial pressure decreased,the deposition rate ...

关 键 词：氮氧化铪薄膜 射频磁控反应溅射 晶体结构 显微结构 力学性能 

分 类 号：TB381[一般工业技术—材料科学与工程]