嵌入式EPROM数据保持能力评估方法优化  

Study on the EPROM Data Retention Capability Evaluation

作　　者：徐海涛[1,2] 王智勇[1] 

机构地区：[1]无锡华润上华科技有限公司,江苏无锡214028 [2]苏州大学电子信息学院微电子系,江苏苏州215021

出　　处：《电子与封装》2011年第1期33-36,共4页Electronics & Packaging

摘　　要：高温加速老化测试是半导体存储器产品可靠性评估必经的步骤。其中产品失效激活能的确定对数据保持能力研究有重要意义,它决定了老化可靠性评估的原则。文章首先介绍了可靠性评估原则的确定方法,然后在不同的温度下进行老化测试,利用数据规一划方法确定了相关重要数据,最后给出了在工艺稳定后的活化能和量产时的数据保持能力测试前烘烤的温度和时间。Data Retention Capability is the Key Characteristic to EPROM,Reliability evaluation methodology for Data Retention is important during Device Qualification.Temperature is used as the accelerated aging factor during evaluation.In the highly competitive semiconductor sector,time and cost are critical factors that provide a competitive edge to any semiconductor company.A speedy,accurate and precise evaluation methodology is the crucial essence of a timely,cost-effective way to fulfill the stringent requirements needed in a Device Qualification.We propose a optimized method to shorten time required in Data Retention evaluation.

关 键 词：存储器 加速因子 可靠性评估 激活能 

分 类 号：TN914[电子电信—通信与信息系统]