基于边界扫描技术的设计复杂性优化研究  

Research on the Optimization of Design Complexity Based on Boundary Scan Technology

作　　者：黄小容[1] 颜学龙[1] 陈寿宏[1] 

机构地区：[1]桂林电子科技大学电子工程与自动化学院,桂林541004

出　　处：《现代计算机（中旬刊）》2014年第4期45-48,共4页Modern Computer

基　　金：国家自然科学基金项目(No.61102012)

摘　　要：对于边界扫描技术的电路系统,可利用现代优化算法对其进行复杂性和测试性改善度的综合优化。主要以较小的复杂性设计来实现测试性的最大化改善,以提高系统测试性优化和缩短系统的测试时间。应用模拟退火算法和模拟退火遗传算法实现系统的设计复杂性优化,相比于贪婪算法,模拟退火算法和模拟退火遗传算法能得到更好的优化率。For the circuit system of boundary scan technology, modern optimization algorithm can be used to do comprehensive optimization of com-plexity design and testability improvement degree. Uses less design complexity to realize the maximization improvement of testability, in order to improve the testability optimization of system and shorten the testing time of system. Uses simulated annealing algorithm and combination genetic algorithm ＆amp; simulated annealing to realize the design complexity optimization of system. Compared with the greedy algorithm, simulated annealing algorithm can get better optimize rate.

关 键 词：边界扫描 拟退火算法 模拟退火遗传算法 设计复杂性 

分 类 号：O242.23[理学—计算数学]