Modeling and simulation of enhancement mode p-GaN Gate AlGaN/GaN HEMT for RF circuit switch applications  被引量:5

Modeling and simulation of enhancement mode p-GaN Gate AlGaN/GaN HEMT for RF circuit switch applications

在线阅读下载全文

作  者:D.K.Panda T.R.Lenka 

机构地区:[1]Microelectronics and VLSI Design Group, Department of Electronics and Communication Engineering, National Institute of Technology Silchar, Assam 788010, India

出  处:《Journal of Semiconductors》2017年第6期52-57,共6页半导体学报(英文版)

基  金:TEQIP-II funded Silvaco TCAD;SMDP-II funded Cadence Tool in Department of Electronics and Communication Engineering,NIT Silchar for carrying out the research work

摘  要:An enhancement mode p-GaN gate AlGaN/GaN HEMT is proposed and a physics based virtual source charge model with Landauer approach for electron transport has been developed using Verilog-A and simulated using Cadence Spectre,in order to predict device characteristics such as threshold voltage,drain current and gate capacitance.The drain current model incorporates important physical effects such as velocity saturation,short channel effects like DIBL(drain induced barrier lowering),channel length modulation(CLM),and mobility degradation due to self-heating.The predicted Id–V(ds),Id–V(gs),and C–V characteristics show an excellent agreement with the experimental data for both drain current and capacitance which validate the model.The developed model was then utilized to design and simulate a single-pole single-throw(SPST)RF switch.An enhancement mode p-GaN gate AlGaN/GaN HEMT is proposed and a physics based virtual source charge model with Landauer approach for electron transport has been developed using Verilog-A and simulated using Cadence Spectre,in order to predict device characteristics such as threshold voltage,drain current and gate capacitance.The drain current model incorporates important physical effects such as velocity saturation,short channel effects like DIBL(drain induced barrier lowering),channel length modulation(CLM),and mobility degradation due to self-heating.The predicted Id–V(ds),Id–V(gs),and C–V characteristics show an excellent agreement with the experimental data for both drain current and capacitance which validate the model.The developed model was then utilized to design and simulate a single-pole single-throw(SPST)RF switch.

关 键 词:CLM DIBL GaN HEMT SPST VERILOG-A 

分 类 号:TN386[电子电信—物理电子学] TM564[电气工程—电器]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象