智能手机大气中子单粒子效应试验研究  

Experimental Study of Atmospheric Neutron Induced Single Event Effects in Smartphones

作　　者：林倩 黄奕铭 张战刚[1,2] 李斌[3] 王松林 梁天骄[4] 吴朝晖 雷志锋 彭超[1,2] 岳少忠[1,2] 何玉娟 黄云 恩云飞 LIN Qian;HUANG Yiming;ZHANG Zhangang;LI Bin;WANG Songlin;LIANG Tianjiao;WU Zhaohui;LEI Zhifeng;PENG Chao;YUE Shaozhong;HE YuJuan;HUANG Yun;EN Yunfei(CEPREI,Guangzhou 511370,China;Science and Technology on Reliability Physics and Application of Electronic Component Laboratory,Guangzhou 511370,China;South China University of'Technology,Guangzhou 510641,China;Spallation Neutron Source Science Center,Dongguan 523803,China)

机构地区：[1]工业和信息化部电子第五研究所,广东广州511370 [2]电子元器件可靠性物理及其应用技术重点实验室,广东广州511370 [3]华南理工大学,广东广州510641 [4]散裂中子源科学中心,广东东莞523803

出　　处：《电子产品可靠性与环境试验》2021年第S01期46-51,共6页Electronic Product Reliability and Environmental Testing

基　　金：广东省省级科技计划项目(2017B090921001)资助。

摘　　要：基于中国散裂中子源BL09终端提供的宽能谱中子束流,开展智能手机大气中子单粒子效应试验研究。发现死机、内存清空和音频波形失真等故障现象,源于中子在7 nm FinFET工艺CPU、DRAM和Flash芯片中引起的单粒子效应。计算由高能中子和热中子产生的各种故障类型的FIT值,发现高能中子产生的错误率较热中子高5~9倍。观测到录音波形出现幅度整体下降、时间维度的前后移位和局部波形失真等异常现象。试验结果表明,大气中子单粒子效应对地面数以亿计的消费电子产品有显著的影响,必须在产品设计时进行加固处理。Based on the broad energy spectrum neutron beam provided by the China spallation neutron source BL09 terminal,an experimental study on the atmospheric neutron single particle effect of smart phone is carried out.It is found that the failure phenomena,such as crashes,memory emptying and audio waveform distortion,are caused by single particle effects caused by neutrons in 7 nm FinFET process CPU,DRAM and Flash chips.The FIT values for various types of faults produced by high energy neutrons and thermal neutrons are calculated.It is found that the error rate of high energy neutrons is 5 to 9 times higher than that of thermal neutrons.And it is observed that the recording wave form has anomalous phenomena such as the overall decrease in amplitute,the back and forth shit of the time,and the distortion of the local waveform.The experimental results show that the single particle effect of atmospheric neutron has a significant effect on hundreds of million of consumer electronic products on the ground,which must be reinforced in product design.

关 键 词：智能手机 大气中子 热中子 软错误 单粒子效应 

分 类 号：TB114.37[理学—概率论与数理统计]