模拟数字转换器AD574总剂量和单粒子翻转的协合效应  

Synergistic effect of total ionizing dose and single-event upset in the analog/digital converterAD 574

作　　者：相传峰 姚帅 于新[2,3] 李小龙[2,3] 陆妩[1,2,3] 王信[2,3] 刘默寒 孙静[2,3] 郭旗[2,3] 蔡娇 杨圣 XIANG Chuanfeng;YAO Shuai;YU Xin;LI Xiaolong;LUWu;WANG Xin;LIU Mohan;SUN Jing;GUO Qi;CAI Jiao;YANG Sheng(College of Physics Science and Technology,Xinjiang University,Urumqi 830046,China;Key Laboratory of Functional Materials and Devices for Special Environments,Xinjiang Technical Institute of Physics and Chemistry,Chinese Academy of Sciences,Urumqi 830011,China;Xinjiang Key Laboratory of Electronic Information Material and Device,Xinjiang Technical Institute of Physics and Chemistry,Chinese Academy of Sciences,Urumqi 830011,China;University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]新疆大学物理科学与技术学院,乌鲁木齐830046 [2]中国科学院新疆理化技术研究所特殊环境功能材料与器件重点实验室,乌鲁木齐830011 [3]中国科学院新疆理化技术研究所新疆电子信息材料与器件重点实验室,乌鲁木齐830011 [4]中国科学院大学,北京100049

出　　处：《辐射研究与辐射工艺学报》2021年第4期91-96,共6页Journal of Radiation Research and Radiation Processing

基　　金：国家自然科学基金(11805270、U1532261、12005293);中科院西部之光项目(2018-XBQNXZ-B-003)资助。

摘　　要：以美国亚德诺半导体技术有限公司bipolar/I2L工艺的1^(2)位模拟数字转换器AD574为研究对象,在^(60)Coγ辐照条件下累积400 Gy(Si)的电离剂量(Totalionizingdose,TID),对累积总剂量前后的样品进行激光单粒子翻转(Single-event upset,SEU)试验,获得了0 V、1 V、2.5 V输入信号条件下的输出码值翻转。结果显示:累积400 Gy(Si)电离剂量后,AD574输出码值的翻转向中心码值右侧偏移,同时造成翻转次数的改变。本文初步分析了AD574的TID-SEU协合效应作用机制,认为该现象与模拟/数字转换器内部比较器单粒子瞬态的敏感性有关。累积总剂量后,比较器单粒子瞬态的幅值和宽度显著增大,会导致AD574输出码值翻转分布及次数的变化。该TID-SEU协合效应研究对宇航元器件的抗辐射加固保障提供了有益参考。This study investigates the AD 574,a 12-bit analog/digital converter(ADC)produced by American Analog Devices,Inc.(ADI)using bipolar/I^(2)L technology.The test samples are subjected to a total ionizing dose(TID)of 400 Gy(Si)under^(60)Coγirradiation.The samples with and without the TID are then subjected to a single event upset(SEU)test,and the upset times of the output codes under the input signal conditions of 0 V,1 V,and 2.5 V are obtained.The test results indicate that,after accumulating a total dose of 400 Gy(Si),the upset of the AD 574 output code shifts toward the right of the center code value,resulting in a change in the upset times.Furthermore,the mechanism of the TID-SEU synergistic effect for the AD 574 is preliminarily analyzed;it is believed that this phenomenon is related to the sensitivity of the ADC internal comparator single-event transient(SET).The amplitude and width of the SET pulse of the comparator with the TID increase significantly;this causes a change in the AD 574 output code value upset distribution and the number of upset times.This study on the TID-SEU synergistic effect serves as a useful reference for aerospace components with radiation hardness.

关 键 词：模拟数字转换器 总剂量效应 单粒子翻转 协合效应 

分 类 号：O774[理学—晶体学] TN710.2[电子电信—电路与系统]