一种具备MBIST功能的Flash型FPGA配置芯片设计  

Design of a Flash-Based FPGA Configuration Chip with MBIST Function

作　　者：柯志鸣 党堃原 单宝琛 丛红艳 KE Zhiming;DANG Kunyuan;SHAN Baochen;CONG Hongyan(East Technology,Inc.,Wuxi 214072,China)

机构地区：[1]中微亿芯有限公司,江苏无锡214072

出　　处：《电子与封装》2022年第11期36-41,共6页Electronics & Packaging

摘　　要：Flash型FPGA配置芯片相较于反熔丝配置芯片和可擦除可编程只读存储器(EPROM)型配置芯片,具有非易失性、功耗低、安全性高、可多次编程等更优异的特点。设计了一款具备存储器内建自测试(MBIST)功能的Flash型FPGA配置芯片,在March C-的基础上,提出了一种更全面的测试算法,该算法可以有效提高测试故障覆盖率,并且自身会对测试结果的正确性进行判断,从而快速有效地对Flash功能的正确性进行检验。由于Flash具有非易失性、集成度高等特点,且设计具备MBIST功能,该配置芯片可以满足复杂场景及广泛的应用需求。Compared with anti-fuse and erasable programmable read only memory(EPROM) type configuration chips, Flash-based FPGA configuration chips have better features such as non-volatility, low power consumption, high security, and multi-programmable. A Flash-based FPGA configuration chip with memory built-in self-test(MBIST) function is designed. A more comprehensive testing algorithm is proposed based on March C-, which can effectively improve the test fault coverage and validate the accuracy of the test results by itself, so that the accuracy of the Flash function can be checked quickly and effectively. Since Flash is non-volatile and highly integrated, and the design has MBIST function, so this configuration chip can meet complex industry scenarios and a wide range of application requirements.

关 键 词：Flash型配置芯片 MBIST 非易失性 FPGA 

分 类 号：TN402[电子电信—微电子学与固体电子学]