高密度混合电路封装技术发展趋势及可靠性评价方法研究  

Research on the development trend and reliability evaluation method of high-density hybrid circuit packaging technology

作　　者：吉美宁 常明超 贾子健 马保梁 王锦 董浩威 范壮壮[1] JI Meining;CHANG Mingchao;JIA Zijian;MA Baoliang;WANG Jin;DONG Haowei;FAN Zhuangzhuang(China Academy of Space Technology,Beijing 100094,China)

机构地区：[1]中国空间技术研究院,北京100094

出　　处：《集成电路与嵌入式系统》2024年第7期25-29,共5页Integrated Circuits and Embedded Systems

摘　　要：电子产品向小型化、智能化方向演进已是必然的发展趋势,高密度集成电路封装技术是实现产品小型化的关键技术。本文对高密度混合集成电路封装技术进行了深入研究,从基板选择、结构设计和散热设计等方面对高密度混合集成电路的封装设计进行了论述。在此基础上,结合国外非气密性混合集成电路保证要求,文章进一步研究了高密度非气密混合集成电路的可靠性评价方法,并通过应用实例说明了评价方法的有效性,可作为国产化非气密性集成电路质量保证体系建设的参考。The evolution of electronic products towards miniaturization and intelligence is an inevitable development trend.High-density integrated circuit packaging technology is a key technology to achieve miniaturization of the product.In this paper,the packaging technology of high-density hybrid integrated circuit is studied.The packaging design of high-density hybrid integrated circuit is discussed from the aspects of substrate selection,structure design and heat dissipation design.On this basis,combined with the reliability requirements for non-hermetic hybrid integrated circuits,the article further studies the reliability evaluation method of high-density and nonhermetic hybrid integrated circuits.The effectiveness of the evaluation method is illustrated through practical examples.It can be used as a reference for the quality assurance system construction of domestic non-hermetic integrated circuits.

关 键 词：混合集成电路 封装技术 可靠性评价 双列直插封装 无引脚芯片载体封装 

分 类 号：TN453[电子电信—微电子学与固体电子学]