微处理器高低速模式下的单粒子功能错误分析  

The Single Event Function Error Analysis of CPU in High/Low Speed Modes

作　　者：郑宏超[1] 岳素格[1] 董攀[1] 陈莉明[1] 陈茂鑫[1] 

机构地区：[1]北京微电子技术研究所,北京100076

出　　处：《微电子学与计算机》2014年第7期18-21,共4页Microelectronics & Computer

摘　　要：对一款国产抗辐射加固SPARC-V8微处理器进行了高低速两种模式下的单粒子试验.试验获得了单粒子功能中断的阈值和饱和错误截面,并预估了GEO轨道在轨错误率.经过比较分析,国产微处理器与国外同类产品具有相同量级的抗单粒子指标,微处理器在开CACHE的高速模式下抗单粒子能力优于低速模式约2倍.In this paper ,the Single Event Effect test was carried out on a domestic radiation -hardened SPARC-V8-microprocessor in high/low speed modes .The Single Event Function Interrupt threshold and cross-sections were got through the experiment ,and the error rate at the GEO orbit was evaluated .The contrast and analysis show that domestic and foreign CPUs have the same order in SEE indicators .The anti-SEE ability of the CPU in the high speed mode(cache-on) is twice better than that in the low speed mode .

关 键 词：单粒子效应 微处理器 单粒子功能错误 单粒子翻转 

分 类 号：TP332[自动化与计算机技术—计算机系统结构]