SOC设计方法学和可测试性设计研究进展  

An Overview of Design Methodology and Design for Testability for SOC's

作　　者：陆盘峰[1] 魏少军[1] 

机构地区：[1]清华大学微电子学研究所,北京100084

出　　处：《微电子学》2004年第3期235-240,共6页Microelectronics

摘　　要：　随着微电子工艺技术和设计方法的发展,系统级芯片(SOC)设计成为解决日益增长的设计复杂度的主要方法。文章概述了SOC设计方法学和SOC可测试性设计的发展现状,阐述了目前SOC测试存在的和需要解决的问题,描述了目前开发的各种SOC测试结构和测试策略。最后,提出了今后进一步研究的方向。With the development of microelectronics technology and design techniques, system-on-a-chip (SOC) is becoming one of the main solutions to handle the increasing complexity of IC design. Latest development of the design methodology and design for testability for SOC's are reviewed. Problems to be solved in testing SOC's are discussed,and different structures and strategies for SOC test are described. Finally, the development trend of SOC design methodology and design for testability are predicted.

关 键 词：系统芯片 设计复用 可测试性设计 测试访问机制 内建自测试 

分 类 号：TN402[电子电信—微电子学与固体电子学] TN407