Supported by National Natural Science Foundation of China(11175223,11305231,11205220)
Nonionizing energy loss(NIEL) has been applied to a number of studies concerning displacement damage effects in materials and devices. However, most studies consider only the contribution of displacement damage effe...
Supported by National Natural Science Foundation of China(11175223,11305231,11205220)
In the fabrication of a 48 mm×48 mm silicon micro-strip nuclear radiation detector with 96 strips on each side, a perfect P-N junction cannot be formed consistently by the one-step implantation process, and thus over...