financially supported by the National Natural Science Foundation of China (grant numbers 31171553 and 31471488);the National Basic Research Program of China (2014CB138100);the National High Technology Research and Development Program of China (2011AA100102 and 2012AA101105);Shandong Seed Engineering Project (2015–2019);the Program of Introducing International Super Agricultural Science and Technology (948 program, 2013-S19)
The rich genetic variation preserved in collections of Aegilops tauschii can be readily exploited to improve common wheat using synthetic hexaploid wheat lines. However,hybrid necrosis, which is characterized by progr...
supported by the National Natural Science Foundation of China(31071405 and 31171553);the National High-Tech R&D Program of China(863 Program,2011AA100102 and 2012AA101105);the Transgenic Special Item,China(2011ZX08002-004 and 2011ZX08009-003);the International Collaboration Program(948 Project,2013-S19);the Doctoral Fund of Ministry of Education of China(20133702120002);the Promotive Research Fund for Young and Middle-Aged Scientisits of Shandong Province,China(BS2013NY006)
Fusarium head blight(FHB),caused primarily by Fusarium graminearum,is a destructive disease of wheat throughout the world.However,the mechanisms of host resistance to FHB are still largely unclear.Deoxynivalenol(DO...
supported by the grants from the National High Technology Research and Development Program of China (No. 2011AA100102);the Chinese Academy of Sciences (No. KSCX2-EW-N-02)
Wheat stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most widely distributed and destructive fungal diseases worldwide. Since 1995, most Chinese wheat cultivars have lost their stripe rust r...
supported by the National High Technology Research and Development Program of China (2011AA100102 and 2006AA10Z174)
Spike number is one of three yield-related factors and is closely related to wheat yield. In the present study, we found that the inhibited and normal tillers of the 3558 line presented phenotypic differences at the e...