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Forced boiling of nonazeotropic immiscible mixture in a supercapillary microchannel array for ultra-high heat flux removal with chip junction temperature below 85℃
《Science China(Technological Sciences)》2024年第5期1364-1380,共17页SUN Bo BAO YuChen TIAN Tong LI Ji 
supported by the National Natural Science Foundation of China(Grant No.51776195)。
In this study,a structure-optimized two-phase microchannel heat sink with sintered submicron nucleation sites was developed and tested.The copper-based microchannels had a rectangular cross-section with an equivalent ...
关键词：MICROCHANNEL sintered powder coating submicron nucleation cavities nonazeotropic immiscible ultra-high heat flux 
Flexible substrates enabled highly integrated patterns with submicron precision toward intrinsically stretchable circuits被引量：1
《SmartMat》2022年第3期503-512,共10页Wenkun Lv Zhaoxin Liu Zheng Li Zhifei Han Yongrui Yang Qi Li Yali Qiao Yanlin Song 
Beijing National Laboratory for Molecular Sciences,Grant/Award Numbers:BNLMSCXXM‐202005,2019BMS20003;National Natural Science Foundation of China,Grant/Award Number:2018YFA0703200;K.C.Wong Education Foundation,and China Postdoctoral Science Foundation,Grant/Award Number:2020M670466;External Cooperation Program of Chinese Academy of Sciences,Grant/Award Number:GJHZ201948;CAS‐VPST Silk Road Science Fund 2022,Grant/Award Number:121111KYSB20210006;National Key R&D Program of China,Grant/Award Numbers:52003276,22175185,52003273,51803217,51773206,91963212,51961145102,22002171。
Fabricating high integration density,high resolution,and intrinsically stretchable patterns by patterned technologies remain challenging.Template printing enabled high-precision patterned fabrication at a facile opera...
关键词：flexible devices highly integrated patterns liquid metal alloys printed electronics stretchable electronics 
Degradation characteristics and mechanism of PMOSFETs under NBT-PBT-NBT stress
《Chinese Physics B》2007年第5期1445-1449,共5页刘红侠 李忠贺 郝跃 
Project supported by the National Natural Science Foundation of China （Grant No 60206006）, the Program for New Century Excellent Talents of Ministry of Education of China （Grant No 681231366）, the National Defense Pre-Research Foundation of China （Grant No 51308040103） and the Key Project of Chinese Ministry of Education （Grant No 104172）.
Degradation characteristics of PMOSFETs under negative bias temperature-positive bias temperature-negative bias temperature （NBT-PBT-NBT） stress conditions are investigated in this paper. It is found that for all de...
关键词：ultra deep submicron PMOSFETs negative bias temperature instability （NBTI） positive bias temperature instability （PBTI） interface traps 
Challenges to Data-Path Physical Design Inside SOC被引量：2
《Journal of Semiconductors》2002年第8期785-793,共9页经彤 洪先龙 蔡懿慈 许静宇 杨长旗 张轶谦 周强 吴为民 
清华大学骨干人才支持计划 ( No.[2 0 0 2 ] 4);国家重点基础研究发展规划 ( No.G-19980 30 40 3)资助项目~~
Previously,a single data-path stack was adequate for data-path chips,and the complexity and size of the data-path was comparatively small.As current data-path chips,such as system-on-a-chip (SOC),become more complex,m...
关键词：physical design data-path bit-sliced structure SYSTEM-ON-A-CHIP giga-scale integrated circuits very-deep-submicron 
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