supported by the National Natural Science Foundation of China(12274112);the Overseas Scientists Sponsorship Program of Hebei Province(C20210330);the S&T Program of Hebei(215676146H and 225676163GH);the State Key Laboratory of Reliability and Intelligence of Electrical Equipment of Hebei University of Technology(EERI_PI2020009);the Australian Research Council(DP190100150 and DP210101436)。
supported by the National Key R&D Program of China (2022YFA1404400 and 2022YFA1404500);the National Natural Science Foundation of China (12074183, 11834008, 12104226, 12225408, and 12227809);the Fundamental Research Funds for the Central Universities (020414380181 and 020414380211);the support from the Funds for Zijin Scholars of Nanjing University;he support from the Spanish Ministry of Science and Innovation through a Consolidación Investigadora grant (CNS2022-135706)。