Project supported by the National Natural Science Foundation of China(Grant Nos.60876061 and 61234006);the Natural Science Foundation of Shaanxi Province,China(Grant No.2013JQ8012);the Doctoral Fund of the Ministry of Education of China(Grant Nos.20130203120017 and 20110203110010)
The non-ideal effect of 4H-SiC bipolar junction transistor (BJT) with a double Gaussian-doped base is characterized and simulated in this paper. By adding a specific interface model between SiC and SiO2, the simulat...
supported by the Ministry of Education of China (Grant No. 20100101110056);the Natural Science Foundation for Distinguished Young Scholars of Zhejiang Province of China (Grant No. R1100468)
In this paper, a novel structure of a 4H-SiC lateral bipolar junction transistor (LBJT) with a base tield plate and double RESURF in the drift region is presented. Collector-base junction depletion extension in the ...
In this paper, a new structure of a 4H-SiC bipolar junction transistor (BJT) with a buried layer (BL) in the base is presented. The current gain shows an approximately 100% increase compared with that of the conve...