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作 者:顾广瑞[1] 李英爱[1] 刘艳梅[2] 陶艳春[3] 何志[1] 殷红[1] 李卫青[1] 冯伟[1] 白玉白[2] 田野[4] 赵永年[1]
机构地区:[1]吉林大学超硬材料国家重点实验室 [2]吉林大学化学学院 [3]吉林大学超分子结构和谱学开放实验室 [4]吉林省科学技术厅
出 处:《吉林大学学报(理学版)》2003年第3期352-355,共4页Journal of Jilin University:Science Edition
基 金:国家自然科学基金(批准号:59831040).
摘 要:利用射频磁控溅射方法,在n型(100)Si基底上沉积了不同厚度(54~124nm)的纳米氮化硼(BN)薄膜.红外光谱分析表明,BN薄膜结构为六角BN(h-BN)相(1380cm-1和780cm-1)结构.在超高真空系统中测量了不同膜厚的场发射特性,发现阈值电压随着厚度的增加而增大.厚度为54nm的BN薄膜样品阈值电场为10V/μm,当外加电场为23V/μm时,最高发射电流为240μA/cm2.BN薄膜场发射F-N曲线表明,在外加电场作用下,电子隧穿了BN薄膜表面势垒发射到真空.Nanometer boron nitride(BN) thin films with various thickness(54~124 nm) were fixed on the (100)oriented surface of nSi(ρ=0008~002 Ω·m) by r.f. magnetic sputtering physical vapor deposition(PVD). There are only two absorption peaks of the hexagonalBN(hBN) at about 1 380 cm-1 and 780 cm-1 in the FTIR spectra of the BN thin films. The field emission characteristics of the thin BN films were measured in a super high vacuum system. It was found that the field emission characteristics of the thin BN films depend evidently on the thickness of the films. A turnon electric field as low as 10 V/μm is obtained for the ~54 nmthick BN film, and the emission current density is estimated to be higher 240 μA/cm2 at an electric field of 23 V/μm. It is shown by FN curves that the electrons emitted from BN penetrate through the potential barrier at the surface of the BN thin film to vacuum tunneling under the exterior electric field action.
关 键 词:氮化硼薄膜 薄膜厚度 场发射特性 薄膜结构 阈值电压 表面粗糙度 场发射显示器
分 类 号:TN873.95[电子电信—信息与通信工程] O484.4[理学—固体物理]
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