supported by the National Key Scientific and Technological Project (Grant No. 2011ZX02503-005);the Fundamental Research Funds for the Central Universities, China (Grant No. ZYGX2010J038);the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20110185120005)
The ruggedness of a superjunction metal-oxide semiconductor field-effect transistor (MOSFET) under unclamped inductive switching conditions is improved by optimizing the avalanche current path. Inserting a P-island ...