METAL-OXIDE-SEMICONDUCTOR

作品数:60被引量:53H指数:3
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相关领域:电子电信更多>>
相关作者:杨霏陶永洪汪玲刘奥陈弘达更多>>
相关机构:国网智能电网研究院南京电子器件研究所中国科学院全球能源互联网研究院更多>>
相关期刊:《Journal of Rare Earths》《系统仿真技术》《Chinese Physics B》《Chinese Physics Letters》更多>>
相关基金:国家自然科学基金国家重点基础研究发展计划国家电网公司科技项目中国博士后科学基金更多>>
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  • 期刊=Journal of Rare Earthsx
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A review of rare-earth oxide films as high k dielectrics in MOS devices——Commemorating the 100th anniversary of the birth of Academician Guangxian Xu被引量:2
《Journal of Rare Earths》2021年第2期121-128,共8页Shuan Li Youyu Lin Siyao Tang Lili Feng Xingguo Li 
MOST of China(2017YFB0405902,2018YFB1502102);China Postdoctoral Science Foundation(BX20200004)。
Recently,rare-earth oxide films have attracted more and more attention as gate dielectrics in metaloxide-semiconductor(MOS)devices,showing the advantages of high dielectric constant(k value),large band gap(Eg)and outs...
关键词:Rare earth Thin film OXIDES High k dielectric METAL-OXIDE-SEMICONDUCTOR 
Electrical characteristics of MOS capacitor using amorphous Gd_2O_3-doped HfO_2 insulator被引量:1
《Journal of Rare Earths》2010年第3期396-398,共3页季梅 王磊 熊玉华 杜军 
supported by the National Key Scientific Research Projects (50932001)
This work described the electrical characteristics of a kind of amorphous Gd2O3-doped HfO2 insulator for high-k metal-oxide-semiconductor(MOS) capacitors.Compared with pure HfO2,the doped HfO2 with an optimum concentr...
关键词:GD2O3 HIGH-K metal-oxide-semiconductor(MOS) rare earths 
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