This paper presents a transient-enhanced NMOS low-dropout regulator (LDO) for portable applications with parallel feedback compensation. The parallel feedback structure adds a dynamic zero to get an adequate phase m...
Project supported by the Key Program of the National Natural Science Foundation of China(No.60836004);the Ministry of Education Creative Team Research Project,China.
Hot carrier effect(HCE) is studied on annular NMOS and two-edged NMOS such as H-shape gate NMOS, T-shape gate NMOS and common two-edged NMOS.Based on the chemical reaction equation of HCE degradation and a geometry ...