supported by the National Natural Science Foundation of China(Grant Nos.61274039 and 51177175);the National Basic Research Program of China(Grant Nos.2010CB923201 and 2011CB301903);the Ph.D. Program Foundation of Ministry of Education of China(Grant No.20110171110021);the Foundation of the Key Technologies R&D Program of Guangdong Province,China(Grant No.2010A081002005)
Crack-free Ga N/In Ga N multiple quantum wells(MQWs) light-emitting diodes(LEDs) are transferred from Si substrate onto electroplating Cu submount with embedded wide p-electrodes. The vertical-conducting n-side-up...
Project supported by the National Natural Science Foundation of China(Grant Nos.61274039 and 51177175);the National Basic Research Program of China(Grant Nos.2010CB923201 and 2011CB301903);the Ph.D.Program Foundation of the Ministry of Education of China(Grant No.20110171110021);the International Science and Technology Collaboration Program of China(Grant No.2012DFG52260);the National High Technology Research and Development Program of China(Grant No.2014AA032606);the International Science and Technology Collaboration Program of Guangdong Province,China(Grant No.2013B051000041);the Opened Fund of the State Key Laboratory on Integrated Optoelectronics(Grant No.IOSKL2014KF17)
The influences of stress on the properties of InGaN/GaN multiple quantum wells (MQWs) grown on silicon substrate were investigated. The different stresses were induced by growing InGaN and A1GaN insertion layers (I...