The National Natural Science Foundation of China(No.61774014);Postgraduate Research&Practice Innovation Program of Jiangsu Province(No.KYZZ15_0331);the Natural Science Foundation of the Jiangsu Higher Education Institutions of China(No.19KJB510060)
With the device size gradually approaching the physical limit, the small changes of the Si(001)/SiO 2 interface in silicon-based devices may have a great impact on the device characteristics. Based on this, the bridge...
Supported by National Natural Science Foundation of China(No.61774014 and No.60772080)
In this paper, an electrical resistance tomography(ERT) imaging method is used as a classifier, and then the Dempster-Shafer's evidence theory with fuzzy clustering is integrated to improve the ERT image quality. The ...