supported by the National Natural Science Foundation of China (No.60603049);the National High Technology Research and Development Program of China (Nos.2008AA110901,2007AA01Z112,2009AA01Z125);the State Key Development Program for Basic Research of China (No.2005CB321600);the Beijing Natural Science Foundation (No.4072024)
Content addressable memory (CAM) is widely used and its tests mostly use functional fault models. However, functional fault models cannot describe some physical faults exactly. This paper introduces physical fault m...