supported by the Ministry of Science and Higher Education of the Russian Federation(agreement No.075-15-2021-1349)。
Synchrotron method of resonant X-ray reflectivity 2D mapping has been applied to study ultrathin epitaxial layers of WS_(2)grown by pulsed laser deposition on Al_(2)O_(3)(0001)substrates.The measurements were carried ...
Project supported by the National Natural Science Foundation of China(Grant Nos.12034018 and 11625419).
Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films,making them unsuitable for frequency measurements of superconducting qubits.In this study,we pr...
financially supported by the National Key Research and Development Program of China(2021YFB3600400);Fujian Science&Technology Innovation Laboratory for Optoelectronic Information of China Project(2020ZZ113 and 2021ZZ130)。
CdSe quantum-dot(QD)film,as the core function layer,plays a key role in various optoelectronic devices.The thickness uniformity of QD films is one of the key factors to determine the overall photoelectric performance....
supported by the National Natural Science Foundation of China(General Program)(Grant No.52275246);Natural Science Foundation of Heilongjiang Province(No.LH2022C061);Heilongjiang Province Postdoctoral Fund(Grant No.LBH-Z19217);Heilongjiang Bayi Agricultural University Three Horizontal and Three Vertical Support Plans(Grant No.ZRCQC201907);Heilongjiang Bayi Agricultural University Adult Talent Research Startup Fund(Grant No.XDB202004).
In maize breeding,limitations on sampling quantity and associated costs for measuring maize grain moisture during filling are imposed by factors like the planting area of new varieties,maize plant density,effective ex...
National Key Research and Development Program of China(2021YFB3600400);Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China(2020ZZ113)。
Non-destructive and accurate inspection of gallium nitride light-emitting diode(Ga N-LED)epitaxial wafers is important to Ga N-LED technology.However,the conventional electroluminescence inspection,the photoluminescen...
In the construction industry,to prevent accidents,non-destructive tests are necessary and cost-effective.Electrical impedance tomography is a new technology in non-invasive imaging in which the image of the inner part...
As semiconductor devices shrink and their manufacturing processes advance,accurately measuring in-cell critical dimensions(CD)becomes increasingly crucial.Traditional test element group(TEG)measurements are becoming i...
Fundamental Research Funds for the Central Universities,Grant/Award Number:20720220036;National Key Research and Development Program of China,Grant/Award Number:2021YFB3401604;Key Scientific and Technological Program of Xiamen,Grant/Award Number:3502Z20231014;Innovation Program for Quantum Science and Technology,Grant/Award Number:2021ZD0303400。
The silicon carbide(SiC)crystal growth is a multiple-phase aggregation process of Si and C atoms.With the development of the clean energy industry,the 4H-SiC has gained increasing attention as it is an ideal material ...
CSIR-CLRI for funding this work under CSIR-Central Leather Research Institute OLP-2318.
Leather,a by-product of the meat industry,has unique strength,elasticity,water vapor permeability,resistance to abrasion,durability,and longevity.In the background of ISO 15115:2019,the authenticity of leather has bec...
This article takes the actual construction project of a certain concrete bridge project as an example to analyze the application of acoustic non-destructive testing technology in its detection.It includes an overview ...