NON-DESTRUCTIVE

作品数:136被引量:191H指数:7
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相关领域:理学机械工程更多>>
相关作者:朱长纯袁寿财逄焕欢冯艳春张学博更多>>
相关机构:西安交通大学中国药品生物制品检定所合肥工业大学北京大学更多>>
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相关基金:国家自然科学基金国家教育部博士点基金国家重点基础研究发展计划中国博士后科学基金更多>>
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Hard X-ray resonant reflectivity studies of ultrathin WS_(2) layers grown by pulsed laser deposition
《Journal of Semiconductors》2025年第3期102-108,共7页Sergey M.Suturin Polina A.Dvortsova Alexander M.Korovin Vladimir V.Fedorov Evgeniya Yu.Lobanova Nikolai S.Sokolov 
supported by the Ministry of Science and Higher Education of the Russian Federation(agreement No.075-15-2021-1349)。
Synchrotron method of resonant X-ray reflectivity 2D mapping has been applied to study ultrathin epitaxial layers of WS_(2)grown by pulsed laser deposition on Al_(2)O_(3)(0001)substrates.The measurements were carried ...
关键词:transition metal dichalcogenides epitaxial multilayers pulsed layer deposition resonant X-ray reflectivity non-destructive depth profiling 
In situ non-destructive measurement of Josephson junction resistance using fritting contact technique
《Chinese Physics B》2024年第11期57-61,共5页Lei Du Hao-Ran Tao Liang-Liang Guo Hai-Feng Zhang Yong Chen Xin Tian Chi Zhang Zhi-Long Jia Peng Duan Guo-Ping Guo 
Project supported by the National Natural Science Foundation of China(Grant Nos.12034018 and 11625419).
Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films,making them unsuitable for frequency measurements of superconducting qubits.In this study,we pr...
关键词:NON-DESTRUCTIVE fritting contact qubit frequency Josephson junction resistance 
Non-contact and non-destructive in-situ inspection for CdSe quantum dot film based on the principle of field-induced photoluminescence quenching
《Science China Materials》2024年第11期3570-3578,共9页Zheng Gong Wenhao Li Shuqian Zhang Junlong Li Hao Su Wei Huang Kun Wang Jiaye Zhu Xiongtu Zhou Yongai Zhang Tailiang Guo Chaoxing Wu 
financially supported by the National Key Research and Development Program of China(2021YFB3600400);Fujian Science&Technology Innovation Laboratory for Optoelectronic Information of China Project(2020ZZ113 and 2021ZZ130)。
CdSe quantum-dot(QD)film,as the core function layer,plays a key role in various optoelectronic devices.The thickness uniformity of QD films is one of the key factors to determine the overall photoelectric performance....
关键词:non-contact inspection non-destructive inspection field-induced photoluminescence quenching quantum dots 
Non-destructive method of small sample sets for the maize moisture content measurement during filling based on NIRS
《International Journal of Agricultural and Biological Engineering》2024年第4期236-244,共9页Tiemin Ma Guangyue Zhang Xue Wang Shujuan Yi Changyuan Wang 
supported by the National Natural Science Foundation of China(General Program)(Grant No.52275246);Natural Science Foundation of Heilongjiang Province(No.LH2022C061);Heilongjiang Province Postdoctoral Fund(Grant No.LBH-Z19217);Heilongjiang Bayi Agricultural University Three Horizontal and Three Vertical Support Plans(Grant No.ZRCQC201907);Heilongjiang Bayi Agricultural University Adult Talent Research Startup Fund(Grant No.XDB202004).
In maize breeding,limitations on sampling quantity and associated costs for measuring maize grain moisture during filling are imposed by factors like the planting area of new varieties,maize plant density,effective ex...
关键词:near-infrared spectroscopy moisture content quantitative analysis small samples optimized maize grain during the filling stage 
Non-destructive electroluminescence inspection for LED epitaxial wafers based on soft single-contact operation
《Photonics Research》2024年第8期1776-1784,共9页HAO SU JIAWEN QIU JUNLONG LI RONG CHEN JIANBI LE XIAOYANG LEI YONGAI ZHANG XIONGTU ZHOU TAILIANG GUO CHAOXING WU 
National Key Research and Development Program of China(2021YFB3600400);Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China(2020ZZ113)。
Non-destructive and accurate inspection of gallium nitride light-emitting diode(Ga N-LED)epitaxial wafers is important to Ga N-LED technology.However,the conventional electroluminescence inspection,the photoluminescen...
关键词:ELECTROLUMINESCENCE operation EPITAXIAL 
An Electrical Impedance Imaging System Towards Edge Intelligence for Non-Destructive Testing of Concrete被引量:1
《Tsinghua Science and Technology》2024年第3期883-896,共14页Abolfazl Roshanpanah Mahdi Abbasi Hani Attar Ayman Amer Mohammad R.Khosravi Ahmed A.Solyman 
In the construction industry,to prevent accidents,non-destructive tests are necessary and cost-effective.Electrical impedance tomography is a new technology in non-invasive imaging in which the image of the inner part...
关键词:non-destructive testing system CONCRETE electrical impedance tomography 
Microsphere-assisted hyperspectral imaging:super-resolution,non-destructive metrology for semiconductor devices
《Light(Science & Applications)》2024年第6期1098-1111,共14页Jangryul Park Youngsun Choi Soonyang Kwon Youngjun Lee Jiwoong Kim Jae-joon Kim Jihye Lee Jeongho Ahn Hidong Kwak Yusin Yang Taeyong Jo Myungjun Lee Kwangrak Kim 
As semiconductor devices shrink and their manufacturing processes advance,accurately measuring in-cell critical dimensions(CD)becomes increasingly crucial.Traditional test element group(TEG)measurements are becoming i...
关键词:METROLOGY RESOLUTION enable 
Non-destructive and deep learning-enhanced characterization of 4H-SiC material
《Aggregate》2024年第3期409-420,共12页Xiaofang Ye Aizhong Zhang Jiaxin Huang Wenyu Kang Wei Jiang Xu Li Jun Yin Junyong Kang 
Fundamental Research Funds for the Central Universities,Grant/Award Number:20720220036;National Key Research and Development Program of China,Grant/Award Number:2021YFB3401604;Key Scientific and Technological Program of Xiamen,Grant/Award Number:3502Z20231014;Innovation Program for Quantum Science and Technology,Grant/Award Number:2021ZD0303400。
The silicon carbide(SiC)crystal growth is a multiple-phase aggregation process of Si and C atoms.With the development of the clean energy industry,the 4H-SiC has gained increasing attention as it is an ideal material ...
关键词:convolutional neural network crystal growth DEFECTS dynamic evolution optical characterization surface morphology 
An approach towards identification of leather from leather-like polymeric material using FTIR-ATR technique
《Collagen and Leather》2024年第1期61-69,共9页Priya Narayanan Sreeram Kalarical Janardhanan 
CSIR-CLRI for funding this work under CSIR-Central Leather Research Institute OLP-2318.
Leather,a by-product of the meat industry,has unique strength,elasticity,water vapor permeability,resistance to abrasion,durability,and longevity.In the background of ISO 15115:2019,the authenticity of leather has bec...
关键词:LEATHER Synthetic leather-like polymeric material NON-DESTRUCTIVE COLLAGEN FTIR-ATR 
Acoustic Non-Destructive Testing Technology in Concrete Bridge Inspection and Pile Foundation Detection
《Journal of Architectural Research and Development》2024年第1期20-25,共6页Wei Fu 
This article takes the actual construction project of a certain concrete bridge project as an example to analyze the application of acoustic non-destructive testing technology in its detection.It includes an overview ...
关键词:Concrete bridge Bridge detection Acoustic detection Non-destructive testing technology 
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