Deep level defects in as-grown and annealed SI-InP samples were investigated by thermally stimulated current spectroscopy. Correlations between electrical property, compensation ratio, thermal stability and deep defec...
Project supported by Special Funds for Major State Basic Research Project (G20000683 and 2002CB311903); National Natural Science Foundation of China (60136020); Key Innovation Program of Chinese Academy of Science and National High Technology R&D Program of China (2002AA305304)
High resistivity unintentionally doped GaN films were grown on (0001) sapphire substrates by metalorganic chemical vapor deposition. The surface morphology of the layer was measured by both atomic force microscopy and...