supported by the National Natural Science Foundation of China (No. 60748001);the Program for New Century Excellent Talents in University of China (No. NCET-05-0897);the Scientific Research Project for Universities in Xinjiang (No. XJEDU2006I10)
An experimental investigation on the nonlinear refractive index of nanoporous silicon at wavelengths of 532 nm and 1064 nm is reported by the reflection z-scan(RZ-scan) method with picosecond pulses.The porous silicon...